X-ray Nano Computed Tomography (160kV)

The world best nano-focus X-ray source together with CdTe detectors provided the best ever resolution at high energy for industrial application.

Grazing-Incident X-ray Diffraction (GIXRD/2θ-scan)

GIXRD at 2θ-scan mode, provide the structural information or prefer orientation of polycrystalline, powder and polymer layers.

Room-Temperature X-ray Powder Diffraction (RT-PXRD)

Determine unknown crystal structure by Rietveld refinement. Study mixture phase and crystal size distribution.

Temperature-Dependence Powder X-ray Diffraction (Heating)

Study the phase transition temperature of materials, or the strain/stress, dislocation, segregation as function of temperature.

Nano-Beam X-Ray Fluroescence Mapping (2D n-XRF)

80 nm spatial resolution to characterized the local elements distribution and more bulk sensitivity compare to SEM. No special pre-condition requirements.

Nano-Beam X-Ray Nanodiffraction (n-XRD)

Laue diffraction with 80 nm spatial resolution to characterized the local deformation, stress and strain partitioning, fatigue, grain growth, and recrystallization.

Nanoscale Transmission X-ray Microscopy (n-TXM)

nano-TXM used capillary to achieved 60 nm spatial resolution which able to perform 2D absorption contrast imaging and 3D computed tomography. This technology were widely use in soft- and bio-materials

Grazing-Incident Wide-Angle X-Ray Scattering (GIWAXS)

GIWAXS is a structural measurement technique to collect wide-angle scattering with grazing-incidence to cover large sample area for average information. These large values of q correspond to

Hard X-ray Near Edge Absorption Fine Structure (HX-NEXAFS)

XANES gives information about the valence state, energy bandwidth and bond angles.

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS)

HX-EXAFS yields information about the interatomic distances, near neighbor coordination numbers, and lattice dynamics.

Soft X-ray Near-Edge Absorption Fine Structure (SX-NEXAFS, 1.75~6 keV)

X-ray absorption near edge structure (XANES), also known as near edge X-ray absorption fine structure (NEXAFS), is a type of absorption spectroscopy that indicates the features in the X-ray absorption

Soft X-ray Near-Edge Absorption Fine Structure (SX-NEXAFS, 0.15~2 keV)

X-ray absorption near edge structure (XANES), also known as near edge X-ray absorption fine structure (NEXAFS), is a type of absorption spectroscopy that indicates the features in the X-ray absorption

Soft X-ray Photoelectron Spectroscopy (SX-XPS)

TLS-07A Beamtime (General XANES/EXAFS)

Perform your special experiments by yourself at beamline without apply proposal to synchrotron facilities in advance.

General SEM Analysis

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in th