Synchrotron Analysis

Specular X-ray Diffraction (θ-2θ scan)

Specular X-ray Diffraction (θ-2θ scan)

Symmetrical X-ray diffraction is applicable for detecting single crystal structures or epitaxial thin films. Through the analysis of diffraction peak width, information such as thickness, stress/strain, and defects can be obtained.
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Grazing-Incident X-ray Diffraction (GIXRD/2θ-scan)

Grazing-Incident X-ray Diffraction (GIXRD/2θ-scan)

GIXRD at 2θ-scan mode, provides the structural information or preferred orientation of polycrystalline, powder, and polymer layers.
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Room-Temperature Powder X-ray Diffraction (RT-PXRD)

Room-Temperature Powder X-ray Diffraction (RT-PXRD)

Determine unknown crystal structure by Rietveld refinement. Study mixture phase and crystal size distribution.
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Temperature-Dependent Powder X-ray Diffraction (TD-PXRD)

Temperature-Dependent Powder X-ray Diffraction (TD-PXRD)

Study the phase transition temperature of materials, or the strain/stress, dislocation, and segregation as a function of temperature.
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Nano-Beam X-Ray Fluorescence Mapping (2D n-XRF)

Nano-Beam X-Ray Fluorescence Mapping (2D n-XRF)

2D nano-X-ray fluorescence (n-XRF) analysis provides detailed elemental mapping and high-resolution imaging at the nanoscale, providing researchers and scientists with valuable insights into sample composition. 80 nm spatial resolution to characterize the distribution of local elements and more bulk sensitivity compared to SEM. There are no special precondition requirements.
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Nano-Beam X-Ray Nanodiffraction (2D n-XRD)

Nano-Beam X-Ray Nanodiffraction (2D n-XRD)

Laue diffraction with 80 nm spatial resolution to characterize the local deformation, stress and strain partitioning, fatigue, grain growth, and recrystallization.
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Nano-Beam X-Ray Absorption Mapping (2D n-XAS)

Nano-Beam X-Ray Absorption Mapping (2D n-XAS)

Absorption mapping give better understand the inhomogeneous distribution (edge-shift) of materials under different treatment conditions.
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Nanoscale Transmission X-ray Microscopy (2D/3D n-TXM)

Nanoscale Transmission X-ray Microscopy (2D/3D n-TXM)

nano-TXM used capillary to achieved 60 nm spatial resolution which able to perform 2D absorption contrast imaging and 3D computed tomography. This technology were widely use in soft- and bio-materials
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Grazing-Incident Wide-Angle X-Ray Scattering (GIWAXS)

Grazing-Incident Wide-Angle X-Ray Scattering (GIWAXS)

GIWAXS is a structural measurement technique to collect wide-angle scattering with grazing incidence to cover a large sample area for average information. These large values of q correspond to
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Hard X-ray Near Edge Absorption Fine Structure (HX-NEXAFS, 5~27 keV)

Hard X-ray Near Edge Absorption Fine Structure (HX-NEXAFS, 5~27 keV)

X-ray Near-Edge Absorption Spectroscopy (XANES) can be used to detect the electronic configuration of specific atoms in materials and determine the crystallographic symmetry of their positions. The near-edge structure of the spectrum is influenced by the symmetry of central atoms, oxidation states, and bonding with surrounding atoms.
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Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~27 keV)

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~27 keV)

The Extended X-ray Absorption Fine Structure (EXAFS) technique utilizes oscillations in the X-ray absorption spectrum beyond the absorption edge to observe the fine structure and electronic configurations of different types of atoms in a material. It is an important tool for studying the microscopic properties of materials, primarily focusing on the local atomic structure to determine distances, types, and numbers of neighboring atoms.
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In-Situ/In-Operando HX-NEXAFS (Electrochemical; IS-HX-NEXAFS, 5~27 keV)

In-Situ/In-Operando HX-NEXAFS (Electrochemical; IS-HX-NEXAFS, 5~27 keV)

In-Situ HX-NEXAFS elucidates the chemical nature of electrocatalysts under reaction conditions.
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