Room Temperature Photoluminescence (RT-PL)

Photoluminescence (PL) spectroscopy is a form of light emission spectroscopy in which the light emission comes from a process called photo-excitation. As the light is directed onto a sample

Room-Temperature Powder X-ray Diffraction (RT-PXRD)

Determine unknown crystal structure by Rietveld refinement. Study mixture phase and crystal size distribution.

Nano-Beam X-Ray Fluorescence Mapping (2D n-XRF)

2D nano-X-ray fluorescence (n-XRF) analysis provides detailed elemental mapping and high-resolution imaging at the nanoscale, providing researchers and scientists with valuable insights into sample composition. 80 nm spatial resolution to characterize the distribution of local elements and more bulk sensitivity compared to SEM. There are no special precondition requirements.

Nano-Beam X-Ray Nanodiffraction (2D n-XRD)

Laue diffraction with 80 nm spatial resolution to characterize the local deformation, stress and strain partitioning, fatigue, grain growth, and recrystallization.

Nano-Beam X-Ray Absorption Mapping (2D n-XAS)

Absorption mapping give better understand the inhomogeneous distribution (edge-shift) of materials under different treatment conditions.

Nanoscale Transmission X-ray Microscopy (2D/3D n-TXM)

nano-TXM used capillary to achieved 60 nm spatial resolution which able to perform 2D absorption contrast imaging and 3D computed tomography. This technology were widely use in soft- and bio-materials

Grazing-Incident Wide-Angle X-Ray Scattering (GI-WAXS)

GIWAXS is a structural measurement technique to collect wide-angle scattering with grazing incidence to cover a large sample area for average information. These large values of q correspond to

Japan Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~30 keV)

The Extended X-ray Absorption Fine Structure (EXAFS) technique utilizes oscillations in the X-ray absorption spectrum beyond the absorption edge to observe the fine structure and electronic configurations of different types of atoms in a material. It is an important tool for studying the microscopic properties of materials, primarily focusing on the local atomic structure to determine distances, types, and numbers of neighboring atoms.

Soft X-ray Near-Edge Absorption Fine Structure (SX-NEXAFS, 0.15~2 keV)

XANES gives information about the valence state, energy bandwidth and bond angles.

Reference Mn-compound K-edge (6539 eV)

Reference Fe-compound K-edge (7112 eV)

Specular X-ray Diffraction (θ-2θ scan)

XRD is a nondestructive method to provides information on crystal structure, phase, orientation or texture, grain size, crystallinity, strain, and crystal defects.