Hard X-ray Absorption

Hard X-ray Near Edge Absorption Fine Structure (HX-NEXAFS, 5~27 keV)

Hard X-ray Near Edge Absorption Fine Structure (HX-NEXAFS, 5~27 keV)

X-ray Near-Edge Absorption Spectroscopy (XANES) can be used to detect the electronic configuration of specific atoms in materials and determine the crystallographic symmetry of their positions. The near-edge structure of the spectrum is influenced by the symmetry of central atoms, oxidation states, and bonding with surrounding atoms.
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Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~27 keV)

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~27 keV)

The Extended X-ray Absorption Fine Structure (EXAFS) technique utilizes oscillations in the X-ray absorption spectrum beyond the absorption edge to observe the fine structure and electronic configurations of different types of atoms in a material. It is an important tool for studying the microscopic properties of materials, primarily focusing on the local atomic structure to determine distances, types, and numbers of neighboring atoms.
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In-Situ/In-Operando HX-NEXAFS (Electrochemical; IS-HX-NEXAFS, 5~27 keV)

In-Situ/In-Operando HX-NEXAFS (Electrochemical; IS-HX-NEXAFS, 5~27 keV)

In-Situ HX-NEXAFS elucidates the chemical nature of electrocatalysts under reaction conditions.
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High Concentration EXAFS Batch Service (5~22 keV, >5wt%)

High Concentration EXAFS Batch Service (5~22 keV, >5wt%)

HX-EXAFS yields information about the interatomic distances, near neighbor coordination numbers, and lattice dynamics.
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Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 14~35 keV)

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 14~35 keV)

HX-EXAFS yields information about the interatomic distances, near neighbor coordination numbers, and lattice dynamics.
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