雷射加熱金屬沈積的熱效應對晶粒晶向的影響簡述
Positive material identification (PMI) 簡述
Pharmaceutical development
In situ XAS provides information regarding adsorbate bonding and atomic arrangements on the electrode surface
XAS and XES measure the unoccupied and occupied electronic structure and thus the band gap
Non-destructive approaches based on synchrotron radiation enabled agricultural and food scientists to analyze structural changes in the material as well as on the surface.
WAXS, could take the peak intensity and observe how these developed from the disordered melt. SAXS may track the rise in electron density and utilize it as a gauge for the rise in crystallinity level
Extremely brilliant infrared (IR) beams provided by synchrotron radiation sources are now routinely used in many facilities with available commercial spectrometers coupled to IR microscopes.
Investigation of microstructure development, deformation, and fatigue behavior of materials were carried out by Neutron and Synchrotron techniques
Demonstrated synchrotron radiation-based near-field imaging of semiconductor structures with a lateral resolution of about 40 nm.
Synchrotron phase contrast X-ray imaging (PCXI) was developed to determine the efficacy of potential cystic fibrosis therapies
