X-ray Photoelectron Spectroscopy (XPS), enriched with in-house capabilities and advanced 2D mapping features, stands as a powerful analytical tool at the forefront of materials science. At its core, XPS operates on the principle of the photoelectric effect, where X-ray irradiation prompts the emission of photoelectrons from the sample's surface. The kinetic and binding energies of these photoelectrons are then meticulously measured, unveiling valuable insights into the elemental composition and chemical states of the material under scrutiny.

The in-house XPS service ensures precision and efficiency in the analytical process, while the incorporation of 2D mapping elevates the analysis to a spatial dimension, allowing for a detailed understanding of the distribution of elements across the sample surface. This integrated approach positions X-ray Photoelectron Spectroscopy with in-house capabilities and 2D mapping as an indispensable technique for researchers and professionals in diverse fields, offering a comprehensive exploration of material properties at the atomic and molecular levels.